Hitachi CMI563 SRP 4 Probe

Hitachi CMI563 SRP 4 probe is a probe device launched by Hitachi for surface resistance and copper thickness measurement. It is part of the CMI563 measurement system. Core functions: Surface resistance measurement: The CMI563 SRP 4 probe can accurately measure the resistance value of the material surface, which is essential for evaluating the performance of conductive materials. In the field of electronic manufacturing, surface resistance measurement is a key link in quality control and helps to ensure that the conductive performance of the product meets the design requirements. Copper thickness measurement: In addition to surface resistance measurement, the probe also has the function of measuring the thickness of the copper layer of the circuit board. Through non-contact or micro-contact methods, the probe can accurately obtain the thickness information of the copper layer, providing strong support for quality control in the circuit board manufacturing process. Oxford SRP-4 probe coo…

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